G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface as technology advances to smaller
$115.50
Description
as technology advances to smaller and smaller dimensions for the elements of high density integrated circuits
Refer to SEMI C90 for additional requirements for the use of polymers in LCDS
This Standard was technically approved by the Flat Panel Display – Color Global Technical Committee
SEMI M20-92 (technical revision)
G06200 - SEMI G62 - 銀めっきの試験方法 StdTpc-Equipment - Facilities Interface as technology advances to smallerglobal Assembly & Packaging Technical Committee201171global Audits and Reviews Subcommittee20118www. semiviews. org www. semi. org199520023 : Referenced SEMI Standards SEMI G55 Test Method for Measurement of Silver Plating Brightness SEMI G56 Test Method for Measurement of Silver Plating Thickness
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